Search for dissertations about: "Microwave FET Modeling and Applications"

Found 3 swedish dissertations containing the words Microwave FET Modeling and Applications.

  2. 1. Microwave FET Modeling and Applications

    Author : Christian Fager; Chalmers tekniska högskola; []
    Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; MESFET; uncertainty; model; FMCW; statistical; HEMT; small-signal; extraction; distortion; intermodulation; CMOS; LDMOS; power amplifier; estimation; FET; large-signal; radar; AM noise;

    Abstract : This thesis deals with three distinct topics within the areas of modeling, analysis and circuit design with microwave field effect transistors (FETs). First, the extraction of FET small-signal model parameters is addressed. READ MORE

  4. 2. Symmetrical FET Modeling

    Author : Ankur Prasad; Chalmers tekniska högskola; []
    Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; switch model; symmetrical model; nonlinear model; small-signal model; GaAs; Microwave FET; GaN;

    Abstract : This thesis deals with empirical modeling of symmetrical Field-Effect Transistors (FETs). It covers three distinct topics within the areas of modeling and parameter extraction of microwave FETs.First, the symmetry of FET devices is addressed. Such devices are often used in transceivers as a building block for switches. READ MORE

  5. 3. Experimentally Based HFET Modeling for Microwave and Millimeter Wave Applications

    Author : Mikael Garcia; Chalmers tekniska högskola; []
    Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; MODFET; soft-breakdown; cold FET; large-signal; source balance; SDHT; dispersion; noise figure; temperature noise model; small-signal; TEGFET; direct extraction; Chalmers model; noise parameters; modeling; HEMT; HFET; noise;

    Abstract : Transistor models are very important in the design of Monolithic Microwave Integrated Circuits (MMICs). Circuit simulations based on accurate transistor models are one of the keys to high circuit yield. Transistor models can also be used to trace problems in the device fabrication processes. READ MORE