Search for dissertations about: "scanning tunneling microscopy spectroscopy"
Showing result 1 - 5 of 51 swedish dissertations containing the words scanning tunneling microscopy spectroscopy.
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1. Electronic and Geometrical Structure of Phthalocyanines on Surfaces : An Electron Spectroscopy and Scanning Tunneling Microscopy Study
Abstract : Core- and Valence Photoelectron Spectroscopy (PES), X-ray- and Ultraviolet-Visible Absorption Spectroscopy (XAS and UV-Vis), Scanning Tunneling Microscopy (STM) and Density Functional Theory (DFT) calculations are used to study the electronic and geometrical structure of a class of macro-cyclic molecules, Phthalocyanines (Pc), on surfaces. These molecules are widely studied due to their application in many different fields. READ MORE
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2. Scanning Tunneling Microscopy Induced Luminescence Studies of Semiconductor Nanostructures
Abstract : This thesis treats scanning tunneling luminescence (STL) investigations of semiconductor nanostructures. The STL technique combines scanning tunneling microscopy (STM) with detection of photons, induced by the tunneling electrons. The high spatial resolution in STM and the local excitation allow for optical investigations on the nanometer-scale. READ MORE
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3. The Cu(111) surface studied by scanning tunnelling microscopy and spectroscopy
Abstract : .... READ MORE
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4. Transmission Electron Microscopy of Semiconductor Nanowires
Abstract : Semiconductor nanowires are studied by using transmission electron microscopy (TEM) based methods in this work. In the first section, the growth mechanism of gallium arsenide nanowires grown by chemical beam epitaxy is investigated. The nanowires are epitaxially grown from a gallium arsenide substrate by using gold seed particles as catalysts. READ MORE
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5. III–V Nanowire Surfaces
Abstract : This dissertation deals with the geometric and electronic structure of surfaces on III–V semiconductor nanowires (NWs). NWs made of InAs, GaAs, and InP have been studied using scanning tunneling microscopy/spectroscopy (STM/S), low energy electron microscopy (LEEM), photoemission electron microscopy (PEEM), and x-ray photoelectron spectroscopy (XPS). READ MORE