Electrical contacts, Ohmic and Schottky, to 4H-Silicon Carbide for device applications

University dissertation from Stockholm : Elektrotekniska system

Author: Sang-kwon Lee; Kth.; [2000]

Keywords: silicon carbice; Ohmic; Schottky contacts; co-evaporation; current-voltage; capacitance-voltage measurement; power device; 4H-SiC; TLM;

Abstract:

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