Search for dissertations about: "ATOMIC-FORCE MICROSCOPE"

Showing result 1 - 5 of 52 swedish dissertations containing the words ATOMIC-FORCE MICROSCOPE.

  2. 1. Surface interactions and adsorbate structures : An atomic force microscopy study

    Author : Goran Bogdanovic; KTH; []
    Keywords : atomic force microscope; AFM; cantilever calibration; colloidal probe; surface force; force curve; friciton; hydrophobic; adhesion; roughness; multilayer; silica; cellulose; cationic polyelectrolyte; MAPTAC;

    Abstract : Atomic force microscopy, AFM, was used for studying somecurrent topics in the field of surface and colloid science. Themain topics addressed in this thesis were: the nature of thelong-range attraction between hydrophobic surfaces; slidingfriction behavior for microscopic contacts; and interfacialstructuring of polyelectrolyte-nanoparticle multilayerfilms. READ MORE

  4. 2. Investigating nano-scale viscous and elastic forces withintermodulation : Studies in multifrequency atomic force microscopy

    Author : Per-Anders Thorén; David B. Haviland; Greg Haugstad; KTH; []
    Keywords : NATURVETENSKAP; NATURAL SCIENCES; Atomic Force Microscopy; Nonlinear dynamics; Soft materials; High- speed friction measurements; Modeling and numerical simulations; Fysik; Physics;

    Abstract : Investigating visco-elastic forces at the nanometer-scale is important to thecharacterization of soft materials. A quantitative force measurement can be ob-tained using an atomic force microscope (AFM) with a calibrated force transducer(the AFM cantilever). READ MORE

  5. 3. Imaging materials with intermodulation : Studies in multifrequency atomic force microscopy

    Author : Daniel Forchheimer; David Haviland; Arvind Raman; KTH; []
    Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; atomic force microscopy; nonlinear dynamics; frequency mixing; force reconstruction; Fysik; Physics;

    Abstract : The Atomic Force Microscope (AFM) is a tool for imaging surfaces at the microand nano meter scale. The microscope senses the force acting between a surfaceand a tip positioned at the end of a micro-cantilever, forming an image of the surface topography. READ MORE

  6. 4. Surface force and friction measurements with an atomic force microscope

    Author : Anders Meurk; KTH; []
    Keywords : ;

    Abstract : .... READ MORE

  7. 5. Atomically Resolved ac-Mode Atomic Force Microscopy in Ultra-High Vacuum

    Author : Lars Olsson; Franz Giessibl; Linköpings universitet; []
    Keywords : NATURVETENSKAP; NATURAL SCIENCES;

    Abstract : When the atomic force microscope (AFM) was invented in 1986, it was anticipated that the technique should be able to produce atomically resolved images with aquality similar to what was routinely obtained with the scanning tunnelling microscope (STM). Even though the AFM quickly became a very popular technique, the development toward ultra-high resolution imaging turned out to be slow due to problems of both fundamental and technical nature. READ MORE