Search for dissertations about: "Metal-Oxide Interface"
Showing result 1 - 5 of 64 swedish dissertations containing the words Metal-Oxide Interface.
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1. Polyethylene – metal oxide particle nanocomposites for future HVDC cable insulation : From interface tailoring to designed performance
Abstract : Low-density polyethylene (LDPE) nanocomposites containing metal oxide nanoparticles are considered as promising candidates for insulating materials in future high-voltage direct-current (HVDC) cables. The significant improvement in dielectric properties compared with unfilled polymer is attributed to the large and active interface between the nanoparticles and the polymer. READ MORE
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2. Nanostructured Metal Oxide Semiconductors for Functional Applications
Abstract : This thesis is about nanostructured metal oxides, their properties, and some of their applications. Semiconducting metal oxides like TiO2, ZnO,and SnO2 have a wide band gap, which means they absorb UV light andgenerate electron-hole pairs. READ MORE
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3. Detection and removal of traps at the SiO2/SiC interface
Abstract : The interface between silicon dioxide (SiO2) and silicon carbide (SiC) is at the heart of the SiC metal-oxide-semiconductor field-effect (MOSFET) transistor. The technology to produce a high quality SiO2/SiC interface does not exist today, hampering further development of the SiC MOSFET. READ MORE
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4. Surface and Interface Studies of ZnO using Reactive Dynamics Simulation
Abstract : About 90% of all chemicals are produced with the help of catalysts, substances with the ability to accelerate reactions without being consumed. Metal oxides play a prominent role in catalysis, since they are able to act reversibly in many chemical processes. Zink oxide (ZnO) is used to catalyse a number of industrially important reactions. READ MORE
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5. Ultrathin Oxides in Metal-Oxide-Silicon Structures: Defects and Characterization
Abstract : The properties of metal-oxide-silicon (MOS) structures with ultrathin oxide layers (15-30 Å) have been investigated by means of electrical characterization. The characterization methods used were mainly capacitance voltage (C-V), current voltage (I-V) and constant voltage stress (I-t) measurements. READ MORE