Search for dissertations about: "Scanning Probe Microscopy"

Showing result 11 - 15 of 91 swedish dissertations containing the words Scanning Probe Microscopy.

2. 11. Carbides in martensitic medium carbon low alloyed tool steels studied with small angle scattering techniques, electron microscopy and atom probe tomography

   Author : Erik Claesson; Peter Hedström; Hans Magnusson; Erik Offerman; KTH; []
   Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Low alloyed tool steel; Martensite; Small angle scattering; Scanning transmission electron microscopy; Energy dispersive x-ray spectroscopy; atom probe tomography; Scanning precession electron diffraction; Precipitation; carbides; Tempering.; Materials Science and Engineering; Teknisk materialvetenskap;

   Abstract : Medium carbon low alloyed tool steels are used today in various areas to shape plastics, nonferrous metals, and steels, and they are crucial in the manufacturing industry. To be effective, tool steels must be strong and tough, and have high wear resistance and temperature stability. READ MORE

4. 12. Near-field scanning optical microscopy and fractal characterization with atomic force microscopy and other methods

   Author : Anders Mannelquist; Luleå tekniska universitet; []
   Keywords : NATURVETENSKAP; NATURAL SCIENCES; Fysik; Fysik;

   Abstract : This thesis is devoted to the development of near-field scanning optical microscopy (NSOM) for aqueous solutions and to fractal characterization of steel surfaces with atomic force microscopy (AFM) and other methods. NSOM combines optical properties from a light microscope and the technique of scanning probe microscopy, SPM (invented in the early 1980’s). READ MORE

5. 13. Scanning probe microscopy studies of interaction forces between particles: emphasis on magnetite, bentonite and silica

   Author : Illia Dobryden; Neil Thomson; Luleå tekniska universitet; []
   Keywords : NATURVETENSKAP; NATURAL SCIENCES; Experimentell fysik; Experimental Physics;

   Abstract : Scanning probe microscopy (SPM), such as the atomic force microscope (AFM), using colloidal probes is a highly suitable technique to probe single particle-particle interactions in aqueous solution. The interaction force between a colloidal probe on the AFM cantilever and sample surface is measured. READ MORE

6. 14. Atomic Scale Characterization of III-V Nanowire Surfaces

   Author : Johan Knutsson; NanoLund: Centre for Nanoscience; []
   Keywords : III–V semiconductor materials; nanowire; surface; scanning tunneling microscopy; wurtzite; zinc blende; scanning tunneling spectroscopy; Fysicumarkivet A:2017:Knutsson;

   Abstract : This dissertation focus on the atomic-scale characterization of the surface properties and electronic structure of III–V semiconductor nanowires (NWs). Since the early 2000s, the fabrication and characterization of III–V NWs has been a very significant topic within material science due to their potential for applications in lighting, energy harvesting, and electronics. READ MORE

7. 15. Towards the Integration of Carbon nanostructures into CMOS technology

   Author : Mohammad Kabir; Chalmers tekniska högskola; []
   Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; transmission electron microscopy TEM .; chemical vapour deposition CVD ; electron beam lithography EBL ; carbon nanotube CNT ; silicidation; atomic force microscopy AFM ; carbon nanofiber CNF ; Complementary metal oxide semiconductor CMOS ; dc-glow discharge plasma; growth mechanism; metal catalyst; scanning electron microscopy SEM ;

   Abstract : Relentless efforts for miniaturization of traditional complementary metal oxide semiconductor (CMOS) devices have reached the limit where the device characteristics are governed by quantum phenomena which are difficult to control. This engendered a need for finding alternative new materials that can be engineered to fabricate devices that will possess at least the same or even better performance than existing CMOS devices. READ MORE