Search for dissertations about: "Schottky contact"
Showing result 21 - 25 of 29 swedish dissertations containing the words Schottky contact.
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21. Tailoring of Contacts on Silicon Carbide - Procedures and Mechanisms
Abstract : Silicon carbide (SiC) exhibits very good electrical, thermal, chemical and mechanical properties which make it suitable for the next generation of wide band gap electronic devices, where silicon (Si) cannot be used due to its limitations with respect to the mentioned properties. Nickel (Ni) and Tantalum (Ta) are among the metals used for the contact formation. READ MORE
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22. Fabrication and Characterization of 3C- and4H-SiC MOSFETs
Abstract : During the last decades, a global effort has been started towards the implementation of energy efficient electronics. Silicon carbide (SiC), a wide band-gap semiconductor is one of the potential candidates to replace the widespread silicon (Si) which enabled and dominates today’s world of electronics. READ MORE
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23. Ag2S-Based Flexible Memristors for Neuromorphic Computing
Abstract : Memristive crossbar arrays hold the great promise for fast and energy efficient neuromorphic computing due to their parallel data storage and processing capabilities. As the key component, memristor should achieve stable resistance switching (RS) characteristics with low energy inputs and be compatible with complementary metal–oxide–semiconductor (CMOS) technology. READ MORE
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24. Processing and characterization of GaN/SiC heterojunctions and SiC bipolar transistors
Abstract : Silicon Carbide (SiC) and Gallium Nitride (GaN) are bothwide bandgap semiconductors that have been suggested for highpower, high voltage, and high temperature applications. Themost investigated SiC devices so far are the Schottky diode,PiN diode and the field effect transistor. READ MORE
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25. High resolution electrical characterization of III-V materials and devices
Abstract : The continuing shrinkage of semiconductor devices towards nanoscale features and increased functionality has prompted a strong need for high-resolution characterization tools capable of mapping the electrical properties with nanoscale lateral resolution. In this regard, scanning capacitance microscopy (SCM) scanning spreading resistance microscopy (SSRM) and Kelvin probe force microscopy (KPFM) have emerged as powerful techniques. READ MORE