Search for dissertations about: "afm microscope"

Showing result 1 - 5 of 41 swedish dissertations containing the words afm microscope.

2. 1. Microsensors for in situ electron microscopy applications

   Author : Alexandra Nafari; Chalmers tekniska högskola; []
   Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; capacitive read-out; Microsensors; In situ TEM; TEM-AFM; TEM-Nanoindenter; AFM; nanoscale characterisation; MEMS; Nanoindentation; piezoresistive read-out;

   Abstract : With the ongoing miniaturisation of devices, the interest in characterising nanoscale physical properties has strongly increased. To further advance the field of nanotechnology new scientific tools are required. READ MORE

4. 2. Scanning probe techniques as an investigation tool for semiconductor nanostructures and devices

   Author : Jovana Colvin; NanoLund: Centre for Nanoscience; []
   Keywords : NATURVETENSKAP; NATURAL SCIENCES; III-V semiconductors; AFM; STM; KPM; SCM; c-AFM; Crystal growth; Doping; Defects;

   Abstract : Semiconductor nanostructure based devices provide new opportunities for contributing to a sustainable energy usage. This includes harvesting of energy (solar cells) and saving of energy, e.g. in lighting (light-emitting diodes, LEDs) and transfer of energy (power devices). READ MORE

5. 3. Surface interactions and adsorbate structures : An atomic force microscopy study

   Author : Goran Bogdanovic; KTH; []
   Keywords : atomic force microscope; AFM; cantilever calibration; colloidal probe; surface force; force curve; friciton; hydrophobic; adhesion; roughness; multilayer; silica; cellulose; cationic polyelectrolyte; MAPTAC;

   Abstract : Atomic force microscopy, AFM, was used for studying somecurrent topics in the field of surface and colloid science. Themain topics addressed in this thesis were: the nature of thelong-range attraction between hydrophobic surfaces; slidingfriction behavior for microscopic contacts; and interfacialstructuring of polyelectrolyte-nanoparticle multilayerfilms. READ MORE

6. 4. Wafer Bonding - Problems and Possibilities

   Author : Mats Bergh; Chalmers tekniska högskola; []
   Keywords : NATURVETENSKAP; NATURAL SCIENCES; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; SOI; atomic force microscope; micromechanics; compliant substrates; wafer bonding; semi-insulating silicon; AFM; surface chemistry; diamond; silicon on insulator; aluminium nitride; microelectronics; surface roughness;

   Abstract : The wafer bonding technology offers a unique opportunity to combine different materials. This has been used for the realisation of novel silicon on insulator (SOI) structures. By replacing the buried silicon dioxide layer with a polycrystalline diamond film the thermal properties of the SOI structure are improved. READ MORE

7. 5. Force measurements using scanning probe microscopy : Applications to advanced powder processing

   Author : Anders Meurk; KTH; []
   Keywords : atomic force microscope; AFM; SPM; van der Waals interaction; DLVO-theory; surface forces; colloidal probe; force curve; friction; adhesion; stick-slip; cantilever; calibration; spring constant; silicon nitride; iron; silica;

   Abstract : The object of this thesis is to apply scanning probemicroscopy (SPM) to the field of advanced powder processing.Measurement of interparticle surface forces at conditionsrelevant to ceramic processing has been performed together withthorough studies of powder friction. READ MORE