Search for dissertations about: "atom-probe field-ion microscopy"
Showing result 1 - 5 of 19 swedish dissertations containing the words atom-probe field-ion microscopy.
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1. Atom-Probe Field-Ion Microscopy of Electronic Materials
Abstract : This thesis presents work in which atom-probe field-ion microscopy (APFIM) has been applied to two types of electronic materials. In the case of metal/GaAs contacts, the purpose was to characterise the microstructure of the contact interface, particularly the chemical composition variation across the interface. READ MORE
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2. Atom-probe microanalysis of the AuGe/GaAs interface
Abstract : .... READ MORE
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3. Atom Probe Field Ion Microscopy of Surface Zones, Coatings and Interfaces
Abstract : This thesis is focused on developingmethods for high resolution microanalysis of coatings on a substrate, andsurface zones of a bulk sample using atom probe field ion microscopy,APFIM. The APFIM technique is described and some examples of its applications to semiconductors,cemented carbides and intermetallic compounds are given. READ MORE
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4. Precipitation Reactions at High Temperatures in 9-12% Chromium Steels
Abstract : This thesis reports on quantitative investigations of microstructural changes, mainly precipitation reactions, occurring during heat treatment, ageing and creep of 9-12% chromium steels. Several alloys with varying composition have been investigated. READ MORE
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5. High Resolution Microanalysis of Creep Resistant 9-12% Chromium Steels
Abstract : This thesis deals with detailed studies of the microstructure of 9-12% chromium steels. Three alloys with improved creep resistance have been studied in different stages of heat treatment and after creep testing. Two of them were manufactured using PM/HIP and were of the type 10. READ MORE