Search for dissertations about: "atomic force microscope"
Showing result 6 - 10 of 53 swedish dissertations containing the words atomic force microscope.
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6. Surface characterization and force measurements applied to industrial materials with atomic force microscopy
Abstract : The thesis focuses on the application of force measurements with atomic force microscopy (AFM) on materials with a few surface contacts/asperities and chemically modified surfaces. The technique allows measurements of ultra-small intermolecular and surface forces, down to the piconewton level. READ MORE
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7. Wafer Bonding - Problems and Possibilities
Abstract : The wafer bonding technology offers a unique opportunity to combine different materials. This has been used for the realisation of novel silicon on insulator (SOI) structures. By replacing the buried silicon dioxide layer with a polycrystalline diamond film the thermal properties of the SOI structure are improved. READ MORE
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8. Mechanical Characterisation of Coatings and Composites-Depth-Sensing Indentation and Finite Element Modelling
Abstract : In the past two decades depth-sensing indentation has becomea widely used technique to measure the mechanical properties ofmaterials. This technique is particularly suitable for thecharacterisation of materials at sub-micro or nano scale thoughthere is a tendency to extend its application to the micro ormacro scale. READ MORE
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9. The Friction between Paper Surfaces
Abstract : The main objective for the work described in this PhD thesiswas to formulate a friction model to characterize thefrictional behavior of paper. More specifically, the modelshould explain a phenomenon that is typical for paper grades,viz.: that the level of paper-to-paper friction is dependent onthe direction and the number of previous slides. READ MORE
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10. The influence of surface microroughness on wafer bonding
Abstract : .... READ MORE