Search for dissertations about: "atomic force microscopy"

Showing result 21 - 25 of 263 swedish dissertations containing the words atomic force microscopy.

  2. 21. On the Adhesion Between Substrates Covered with Polyelectrolyte Multilayers

    Author : Rikard Lingström; Lars Wågberg; Lennart Piculell; KTH; []
    Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; fibre; polyelectorlyte; multilayer; wettability; contact angle; paper strength; atomic force microscopy; surface force apparatus; Cellulose and paper engineering; Cellulosa- och pappersteknik;

    Abstract : This thesis examines the formation of Polyelectrolyte Multilayers (PEM) on cellulose fibres as a new way of influencing the fibre surface and the adhesion between wood fibres. The aim of the study was to enhance the fundamental understanding of the adsorption mechanisms behind the formation of Polyelectrolyte Multilayers on cellulose fibres; to study how the properties of the layers can be influenced and to show how the properties of the layers influence the adhesion between the fibres and the strength of paper sheets made from the PEM treated fibres. READ MORE

  4. 22. Fractal analysis and surface characterization by atomic force microscopy and other methods

    Author : Anders Mannelquist; Luleå tekniska universitet; []
    Keywords : NATURVETENSKAP; NATURAL SCIENCES; Fysik; Fysik;

    Abstract : This licentiate thesis focuses on fractal analysis of surfaces measured with atomic force microscopy (AFM) and other microscopic methods, and the correlation between fractal dimensions and tensile strength for pre-treated stainless-steel surfaces. The disadvantage is that the probe biases the image and the roughness measurement. READ MORE

  5. 23. Structure, Morphology, and Catalytic Properties of CuOx/CeO2 Model Catalysts

    Author : Björn Skårman; Centrum för analys och syntes; []
    Keywords : NATURVETENSKAP; NATURAL SCIENCES; Synchrotron radiation; High-energy Diffraction; X-ray Absorption Fine Structure Spectroscopy.; Chemical technology and engineering; Kemiteknik och kemisk teknologi; Chemistry; Kemi; Material technology; Materiallära; materialteknik; X-ray photoelectron spectroscopy; Atomic force microscopy; Gatan Image Filter GIF ; Energy-filtered TEM; High-resolution electron microscopy; Inert gas condensation IGC ; rf Magnetron sputtering; Thermal activation; Batch reactor; Carbon monoxide oxidation; Surface sensitivity; Catalytic anisotropy; Growth; Nucleation; Topography; Roughness; Core-shell structures; Morphology; Nanostructured; Nanocomposite; Nanoparticles; Surface structure; Polycrystalline surfaces; Thin films; Copper oxide; Cerium dioxide CeO2 ; Ceria;

    Abstract : Cerium dioxide, or ceria, is a chemically stable oxygen ion conducting material with a capacity to store and release oxygen, and is therefore extensively used in combustion catalysts. The Cu-Ce-O system has been identified as one of the most active catalysts for the combustion of carbon monoxide. READ MORE

  6. 24. Surface Force and Friction : effects of adsorbed layers and surface topography

    Author : Xiaoyan Liu; Per Claesson; Bjorn Torger Stokke; KTH; []
    Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Friction; nanotribology; surface forces; diblock copolymer; lipid; QCM-D; AFM; optical reflectometry; neutron reflectivity; X-ray reflectivity; micro-patterned surface; Kemi; Chemistry;

    Abstract : Interfacial features of polymers are a complex, fascinating topic, and industrially very important. There is clearly a need to understand interactions between polymer layers as they can be used for controlling surface properties, colloidal stability and lubrication. The aim of my Ph. READ MORE

  7. 25. Towards the Integration of Carbon nanostructures into CMOS technology

    Author : Mohammad Kabir; Chalmers tekniska högskola; []
    Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; transmission electron microscopy TEM .; chemical vapour deposition CVD ; electron beam lithography EBL ; carbon nanotube CNT ; silicidation; atomic force microscopy AFM ; carbon nanofiber CNF ; Complementary metal oxide semiconductor CMOS ; dc-glow discharge plasma; growth mechanism; metal catalyst; scanning electron microscopy SEM ;

    Abstract : Relentless efforts for miniaturization of traditional complementary metal oxide semiconductor (CMOS) devices have reached the limit where the device characteristics are governed by quantum phenomena which are difficult to control. This engendered a need for finding alternative new materials that can be engineered to fabricate devices that will possess at least the same or even better performance than existing CMOS devices. READ MORE