Search for dissertations about: "deep-level"

Showing result 1 - 5 of 35 swedish dissertations containing the word deep-level.

  2. 1. Optical Characterization of Deep Level Defects in SiC

    Author : Andreas Gällström; Erik Janzén; Ivan Ivanov; Jörg Weber; Linköpings universitet; []
    Keywords : NATURVETENSKAP; NATURAL SCIENCES;

    Abstract : Silicon Carbide (SiC) has long been considered a promising semiconductor material for high power devices, and has also recently found to be one of the emergent materials for quantum computing. Important for these applications are both the quality and purity of the crystal. READ MORE

  4. 2. Epitaxial growth and deep level characterization of GaAs₁₋xPx

    Author : Pär Omling; Fasta tillståndets fysik; []
    Keywords : NATURVETENSKAP; NATURAL SCIENCES; Fysicumarkivet A:1983:Omling;

    Abstract : [abstract missing].... READ MORE

  5. 3. Methods for theoretical studies of the electronic structure of deep level impurities in semiconductors

    Author : Ulf Lindefelt; Lunds universitet; []
    Keywords : NATURAL SCIENCES; NATURVETENSKAP;

    Abstract : .... READ MORE

  6. 4. Growth and characterization of SiC and GaN

    Author : Rafal Ciechonski; Erik Janzén; Sebastian Lourdudoss; Linköpings universitet; []
    Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; SiC; GaN; Deep level transient spectroscopy; Minority Carrier Transient Spectroscopy; Hall effect; Cathodoluminescence; Scanning electron microscopy; Atomic Force microscopy; sublimation growth; MOCVD; heterostructures; High Electron Mobility transistor; point defects; Material physics with surface physics; Materialfysik med ytfysik;

    Abstract : At present, focus of the SiC crystal growth development is on improving the crystalline quality without polytype inclusions, micropipes and the occurrence of extended defects. The purity of the grown material, as well as intentional doping must be well controlled and the processes understood. READ MORE

  7. 5. The influence of process-induced defects on electrical properties of silicon junctions

    Author : Gert I. Andersson; Chalmers tekniska högskola; []
    Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; tunneling; ; silicon emitter junctions; discrete conductance fluctuation; shallow doping; deep-level transient spectroscopy;

    Abstract : .... READ MORE