Search for dissertations about: "electronics and photonics Other electrical engineering"
Showing result 1 - 5 of 100 swedish dissertations containing the words electronics and photonics Other electrical engineering.
-
1. Spectral Mammography with X-Ray Optics and a Photon-Counting Detector
Abstract : Early detection is vital to successfully treating breast cancer, and mammography screening is the most efficient and wide-spread method to reach this goal. Imaging low-contrast targets, while minimizing the radiation exposure to a large population is, however, a major challenge. READ MORE
-
2. Recognition of printed Sinhala characters by direction fields
Abstract : Although substantial research has been carried out on Optical Character Recognition (OCR) where a printed or a handwritten document of script is read as an image and converted to the editable text format, for various languages during the last 30 years, majority of Brahmi descended south Asian scripts are yet to achieve a commercial OCR system.... READ MORE
-
3. VCSEL Cavity Engineering for High Speed Modulation and Silicon Photonics Integration
Abstract : The GaAs-based vertical-cavity surface-emitting laser (VCSEL) is the standard light source in today's optical interconnects, due to its energy efficiency, low cost, and high speed already at low drive currents. The latest commercial VCSELs operate at data rates of up to 28 Gb/s, but it is expected that higher speeds will be required in the near future. READ MORE
-
4. Fabrication Technology for Efficient High Power Silicon Carbide Bipolar Junction Transistors
Abstract : The superior characteristics of Silicon Carbide as a wide band gap semiconductor have motivated many industrial and non-industrial research groups to consider SiC for the next generations of high power semiconductor devices. The SiC Bipolar Junction Transistor (BJT) is one candidate for high power applications due to its low on-state power loss and fast switching capability. READ MORE
-
5. High resolution electrical characterization of III-V materials and devices
Abstract : The continuing shrinkage of semiconductor devices towards nanoscale features and increased functionality has prompted a strong need for high-resolution characterization tools capable of mapping the electrical properties with nanoscale lateral resolution. In this regard, scanning capacitance microscopy (SCM) scanning spreading resistance microscopy (SSRM) and Kelvin probe force microscopy (KPFM) have emerged as powerful techniques. READ MORE