Search for dissertations about: "focused ion beam FIB milling"

Showing result 1 - 5 of 11 swedish dissertations containing the words focused ion beam FIB milling.

2. 1. 3D Reconstruction of Porous and Poorly Conductive Soft Materials using FIB-SEM Tomography

   Author : Cecilia Fager; Chalmers tekniska högskola; []
   Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; NATURVETENSKAP; NATURAL SCIENCES; NATURVETENSKAP; NATURAL SCIENCES; insulating material; 3D; interconnectivity; focused ion beam; tomography; polymer film; scanning electron microscopy;

   Abstract : Focused ion beam combined with scanning electron microscope (FIB-SEM) is a powerful tool that can be utilised to reveal the internal microstructure of materials. It basically uses ions to make cross-sections with high precision and electrons to image the cross-section surface with high spatial resolution. READ MORE

4. 2. On the deformation behavior and cracking of ductile iron; effect of microstructure

   Author : Keivan Amiri Kasvayee; Anders E.W. Jarfors; Jens Bergström; Jönköping University; []
   Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Spherical graphite iron; component casting; high silicon ductile iron; digital image correlation DIC ; in-situ tensile testing; in-situ cyclic testing; DIC pattern generation; pit etching; micro-scale deformation; micro-crack; finite element analysis FEA ; focused ion beam FIB milling; segjärn; komponentgjutning; högkisellegerat segjärn; digital image correlation DIC ; insitu dragprovning; in-situ cyklisk provning; DIC-mönstergenerering; grop-etsning; mikroskalig deformation; mikrosprickor; finite element analys FEA ; fokuserad jonstråle FIB avverkning;

   Abstract : This thesis focuses on the effect of microstructural variation on the mechanical properties and deformation behavior of ductile iron. To research and determine these effects, two grades of ductile iron, (i) GJS-500-7 and (ii) high silicon GJS-500-14, were cast in a geometry containing several plates with different section thicknesses in order to produce microstructural variation. READ MORE

5. 3. Mechanisms of Plastic Deformation of Cemented Carbide and Cermet Cutting Tools

   Author : Gustaf Östberg; Chalmers tekniska högskola; []
   Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; SEM; cermets; TEM; plastic deformation; ab initio calculations; EFTEM; APFIM; FIB; cemented carbides; EBSD;

   Abstract : In this thesis, the physical mechanisms acting during plastic deformation of hardmetals used in metal cutting applications have been investigated. Microstructural and microanalytical studies have been performed on cemented carbides as well as cermet materials. READ MORE

6. 4. Magnesium Diboride (MgB2) and Ca-doped YBa2Cu3O7-? : Thin Films and Devices. Fabrication and Characterization

   Author : Anayesu Malisa; Chalmers tekniska högskola; []
   Keywords : NATURVETENSKAP; NATURAL SCIENCES; Ca-doped YBa2Cu3O7-?; MgB2; bicrystal; superconductor; nanobridge; thin film; Josephson effect; Josephson junction;

   Abstract : Magnesium diboride (MgB2) is a superconductor with an exceptionally high transition temperature, Tc, of 39 K. This work describes deposition of high quality and superconducting films of MgB2 for electronic applications. Experiments on Ca-doped YBa2Cu3O7-? films and fabrication of bicrystal Josephson junctions are also described. READ MORE

7. 5. Characterization of Surfaces Relevant to Nanotechnology

   Author : Emelie Hilner; Synkrotronljusfysik; []
   Keywords : NATURVETENSKAP; NATURAL SCIENCES; nanotechnology; surface science; semiconductors; scanning tunneling microscopy; spectroscopic photoemission and low energy electron microscopy; low energy electron diffraction;

   Abstract : In this thesis investigations of the structure and dynamics of semiconductor surfaces relevant for the synthesis of nanostructures are presented. The studies were performed using Scanning Tunneling Microscopy (STM), Low Energy Electron Diffraction (LEED), and Spectroscopic PhotoEmission and Low Energy Electron Microcopy (SPELEEM). READ MORE