Search for dissertations about: "force method"

Showing result 1 - 5 of 717 swedish dissertations containing the words force method.

2. 1. Surface interactions and adsorbate structures : An atomic force microscopy study

   Author : Goran Bogdanovic; KTH; []
   Keywords : atomic force microscope; AFM; cantilever calibration; colloidal probe; surface force; force curve; friciton; hydrophobic; adhesion; roughness; multilayer; silica; cellulose; cationic polyelectrolyte; MAPTAC;

   Abstract : Atomic force microscopy, AFM, was used for studying somecurrent topics in the field of surface and colloid science. Themain topics addressed in this thesis were: the nature of thelong-range attraction between hydrophobic surfaces; slidingfriction behavior for microscopic contacts; and interfacialstructuring of polyelectrolyte-nanoparticle multilayerfilms. READ MORE

4. 2. Potential Flow Panel Methods for the Calculation of Free-surface Flows with Lift

   Author : Carl-Erik Janson; Chalmers tekniska högskola; []
   Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; desingularized; shape optimization; Rankine source; waves; OCTOPUS; dipole; MMA; Dawson operator; boundary layer; vortex; Method of Moving Asymptotes; nonlinear; sailing yacht; four point operator; surface piercing wing; Navier-Stokes; numerical method; lift force; raised panel method; discrete Fourier transform; collocation point shift; potential flow; CFD; free surface; induced drag; SHIPFLOW; dispersion; damping; analytical method; hydrofoil;

   Abstract : Two non-linear Rankine-source panel methods are developed and implemented in the same computer code. The first method uses a four-point upwind operator on the free-surface to compute the velocity derivatives and to enforce the radiation condition while the second method uses an analytical expression for the velocity derivatives and a collocation point shift one panel upstream to prevent upstream waves. READ MORE

5. 3. Reconstructing force from harmonic motion

   Author : Daniel Platz; David B. Haviland; John E. Sader; KTH; []
   Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; oscillator; force spectroscopy; atomic force microscopy; intermodulation; multifrequency; inverse problem; high quality factor;

   Abstract : High-quality factor oscillators are often used in measurements of verysmall force since they exhibit an enhanced sensitivity in the narrow frequencyband around resonance. Forces containing frequencies outside this frequencyband are often not detectable and the total force acting on the oscillatorremains unknown. READ MORE

6. 4. Force measurements using scanning probe microscopy : Applications to advanced powder processing

   Author : Anders Meurk; KTH; []
   Keywords : atomic force microscope; AFM; SPM; van der Waals interaction; DLVO-theory; surface forces; colloidal probe; force curve; friction; adhesion; stick-slip; cantilever; calibration; spring constant; silicon nitride; iron; silica;

   Abstract : The object of this thesis is to apply scanning probemicroscopy (SPM) to the field of advanced powder processing.Measurement of interparticle surface forces at conditionsrelevant to ceramic processing has been performed together withthorough studies of powder friction. READ MORE

7. 5. Imaging materials with intermodulation : Studies in multifrequency atomic force microscopy

   Author : Daniel Forchheimer; David Haviland; Arvind Raman; KTH; []
   Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; atomic force microscopy; nonlinear dynamics; frequency mixing; force reconstruction; Fysik; Physics;

   Abstract : The Atomic Force Microscope (AFM) is a tool for imaging surfaces at the microand nano meter scale. The microscope senses the force acting between a surfaceand a tip positioned at the end of a micro-cantilever, forming an image of the surface topography. READ MORE