Search for dissertations about: "lars peter ekberg"

Found 4 swedish dissertations containing the words lars peter ekberg.

  2. 1. Development of ultra-precision tools for metrology and lithography of large area photomasks and high definition displays

    Author : Lars Peter Ekberg; Lars Mattsson; Lars Stiblert; Richard Leach; KTH; []
    Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Ultra precision 2D metrology; LCD-display; OLED-display; nm-resolution; random phase measurement; large area; photomask; acousto-optic deflection; self-calibration; Z-correction; absolute accuracy; uncertainty.; SRA - Production; SRA - Produktion;

    Abstract : Large area flat displays are nowadays considered being a commodity. After the era of bulky CRT TV technology, LCD and OLED have taken over as the most prevalent technologies for high quality image display devices. READ MORE

  4. 2. Ultra precision metrology : the key for mask lithography and manufacturing of high definition displays

    Author : Peter Ekberg; Lars Mattsson; Torgny Carlsson; KTH; []
    Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Ultra precision metrology; LCD-display; OLED-display; nm-resolution; large area; random phase measurement; acousto-optic deflection; scanning; 2D measurement; mask; CCD; CMOS; image processing; edge detection; TECHNOLOGY; TEKNIKVETENSKAP; Manufacturing engineering; Produktionsteknik;

    Abstract : Metrology is the science of measurement. It is also a prerequisite for maintaining a high quality in all manufacturing processes. In this thesis we will present the demands and solutions for ultra-precision metrology in the manufacturing of lithography masks for the TV-display industry. READ MORE

  5. 3. Enhanced image analysis, a tool for precision metrology in the micro and macro world

    Author : Bita Daemi; Lars Mattsson; Peter Ekberg; Mikael Sjödahl; KTH; []
    Keywords : Image processing; image metrology; precision metrology; image correlation; subpixel; accuracy; uncertainty; Production Engineering; Industriell produktion;

    Abstract : The need for high speed and cost efficient inspection in manufacturing lineshas led to a vast usage of camera-based vision systems. The performance ofthese systems is sufficient to determine shape and size, but hardly to an accuracylevel comparable with traditional metrology tools. READ MORE

  6. 4. Improved inspection and micrometrology of embedded structures in multi-layered ceramics : Development of optical coherence tomographic methods and tools

    Author : Rong Su; Lars Mattsson; Peter Ekberg; Jerzy Pluciński; KTH; []
    Keywords : Metrology; Optical Coherence Tomography; Ceramics; Embedded Structure; Multilayer; Nondestructive Testing; Optical Inspection; Critical Dimension Measurement; Infrared Imaging; Scattering; Mie Calculation; Image Processing; Monte Carlo Simulation; 测量学， 光学相干断层扫描术，陶瓷，嵌入式结构，多层，无损检测，光学检测，关键尺寸测量，红外成像，散射，Mie计算，图像处理，Monte Carlo模拟; SRA - Production; SRA - Produktion;

    Abstract : Roll-to-roll manufacturing of micro components based on advanced printing, structuring and lamination of ceramic tapes is rapidly progressing. This large-scale and cost-effective manufacturing process of ceramic micro devices is however prone to hide defects within the visually opaque tape stacks. READ MORE