Search for dissertations about: "meis"
Showing result 1 - 5 of 8 swedish dissertations containing the word meis.
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1. Heritable TP53-related cancer syndrome in Sweden : characterisation of genotype-phenotype correlation and surveillance
Abstract : Around 25% of all cancers are considered as familial and are caused by an inherited susceptibility to develop certain tumours. But only 5-10% are hereditary and caused by known high risk cancer genes associated with specific cancer risk syndromes. READ MORE
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2. Electronic excitation, luminescence and particle emission : Studying ion-induced phenomena in ToF-MEIS
Abstract : Medium energy ion scattering (MEIS) is an experimental technique for the high-resolution depth profiling of thin films. Commonly, ions with energies between several ten to a few hundred keV are employed as probes, and backscattered particles are detected. READ MORE
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3. Mechanisms controlling striatal projection neurone generation, from patterning to early differentiation
Abstract : The striatum is part of the telencephalon, the most anterior part of the vertebrate brain. From when it first can be identified, telencephalic morphology is highly complex and a wide range of mechanisms has been suggested to participate in its induction, patterning and neurogenesis. READ MORE
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4. Beyond scattering – what more can be learned from pulsed keV ion beams?
Abstract : Interactions of energetic ions with matter govern processes as diverse as the influence of solar wind, hadron therapy for cancer treatment and plasma-wall interactions in fusion devices, and are used for controlled manipulation of materials properties as well as analytical methods. The scattering of ions from target nuclei and electrons does not only lead to energy deposition, but can induce the emission of different secondary particles including electrons, photons, sputtered target ions and neutrals as well as nuclear reaction products. READ MORE
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5. New aspects of electronic interactions of keV ions with matter
Abstract : Low- and medium-energy ion scattering are powerful techniques to perform high-resolution depth profiling with sub-nanometer resolution. Typically, ions with primary energies between a few keV and a few hundred keV are used to probe the sample and backscattered projectiles are detected. READ MORE