Search for dissertations about: "small sample properties"

Showing result 16 - 20 of 172 swedish dissertations containing the words small sample properties.

  1. 16. Analysis of Arctic ice cloud properties using in-situ and remote sensing measurements

    University dissertation from Luleå : Luleå University of Technology

    Author : Veronika Wolf; Luleå tekniska universitet.; [2019]
    Keywords : NATURVETENSKAP; NATURAL SCIENCES; Arctic cirrus clouds; ice particle properties; in-situ measurements; in-situ and lidar comparison; Atmospheric science; Atmosfärsvetenskap;

    Abstract : Cirrus clouds play an important role in the radiation balance of the atmosphere as theycan have a warming and cooling effect. The resulting net radiation effect depends ontheir micro- and macrophysical properties such as particle size, shape, and numberconcentration. READ MORE

  2. 17. Optical Properties of Single Silicon Quantum Dots

    University dissertation from KTH Royal Institute of Technology

    Author : Federico Pevere; KTH.; [2018]
    Keywords : NATURVETENSKAP; NATURAL SCIENCES; silicon; nanocrystals; quantum dots; photoluminescence; optics; emission; absorption; Physics; Fysik;

    Abstract : For over 60 years silicon (Si) has dominated the semiconductor microelectronics industry mainly due to its abundance and good electrical and material properties. The advanced processing technology of Si has made it the workhorse for photovoltaics industry as well. READ MORE

  3. 18. Extreme Value Analysis of Huge Datasets: Tail Estimation Methods in High-Throughput Screening and Bioinformatics

    University dissertation from Göteborg : University of Gothenburg

    Author : Dmitrii Zholud; Göteborgs universitet.; Gothenburg University.; [2011]
    Keywords : NATURVETENSKAP; NATURAL SCIENCES; Extreme Value Statistics; High-Throughput Screening; HTS; Bioinformatics; analysis of huge datasets; quality control; correction of theoretical p-values; comparison of pre-processing methods; SmartTail; estimation of False Discovery Rates; test power; distribution tail; high level excursions; quantile estimation; multiple testing; Student t−test; Welch statistic; small sample sizes; F−test; Wiener process; Gaussian random walk; Shepp statistic; limit theorems; exotic options.;

    Abstract : This thesis presents results in Extreme Value Theory with applications to High-Throughput Screening and Bioinformatics. The methods described here, however, are applicable to statistical analysis of huge datasets in general. The main results are covered in four papers. READ MORE

  4. 19. Magnetic properties of transition metal compounds and superlattices

    University dissertation from Uppsala : Acta Universitatis Upsaliensis

    Author : Arvid Broddefalk; Uppsala universitet.; [2000]
    Keywords : TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; Materials science; Magnetic order; magnetocrystalline anisotropy; interlayer exchange coupling; transition metal compounds; superlattices; Materialvetenskap; TECHNOLOGY Materials science; TEKNIKVETENSKAP Teknisk materialvetenskap; Solid State Physics; fasta tillståndets fysik;

    Abstract : Magnetic properties of selected compounds and superlattices have been experimentally studied using SQUID (superconducting quantum interference device) and VSM (vibrating sample magnetometer) magnetometry, neutron diffraction and Mössbauer spectroscopy measurements combined with theoretical ab initio calculations. The magnetic compounds (Fe1-xMx)3P, M=Co or Mn have been studied extensively. READ MORE

  5. 20. Optical properties of some complex defects in silicon

    University dissertation from Linköping, Sweden : Department of Physics and Measurement Technology

    Author : Johan Svensson; Linköpings universitet.; Linköpings universitet.; [1990]

    Abstract : lnfrared absorption spectroscopy has been used study transitions between electronic states related to some complex defects in silicon. Three different defects have been studied: a complex defect involving carbon as one of its constituents, a divacancy, and a defect found in silicon containing tin. READ MORE