Electron states in high-k dielectric/silicon structures

Author: Bahman Raeissi; Chalmers Tekniska Högskola.; Chalmers University Of Technology.; [2008]

Keywords: TEKNIKVETENSKAP; TECHNOLOGY; TEKNIKVETENSKAP; TECHNOLOGY; TEKNIKVETENSKAP; TECHNOLOGY; High-k dielectrics; electron states; MOS;

Abstract:

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