Characterisation of bipolar transistors : parameter extraction and degradation dynamics

University dissertation from Chalmers University of Technology

Author: Fredrik Ingvarson; Chalmers Tekniska Högskola.; Chalmers University Of Technology.; [1998]

Keywords: TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; parameter extraction; direct extraction; bipolar junction transistor; Gummel-Poon transistor model; early effect; series resistance extraction; current gain degradation; reverse-bias stress; stress dynamics; recovery dynamics;

Abstract:

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