Characterization and modeling of electrically active point defects in silicon/silcon dioxide structures

University dissertation from Chalmers University of Technology

Author: Mats O. Andersson; Chalmers Tekniska Högskola.; Chalmers University Of Technology.; [1991]

Keywords: TEKNIK OCH TEKNOLOGIER; ENGINEERING AND TECHNOLOGY; electro-optical techniques; MOS capacitors;

Abstract:

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